Accelerated testing of on-board diagnostics

Spencer Graves, Søren Bisgaard, Murat Kulahci, John Van Gilder, John James, Ken Marko, Hal Zatorski, Tom Ting, Cuiping Wu. Accelerated testing of on-board diagnostics. Quality and Reliability Eng. Int., 23(2):189-201, 2007. [doi]

Authors

Spencer Graves

This author has not been identified. Look up 'Spencer Graves' in Google

Søren Bisgaard

This author has not been identified. Look up 'Søren Bisgaard' in Google

Murat Kulahci

This author has not been identified. Look up 'Murat Kulahci' in Google

John Van Gilder

This author has not been identified. Look up 'John Van Gilder' in Google

John James

This author has not been identified. Look up 'John James' in Google

Ken Marko

This author has not been identified. Look up 'Ken Marko' in Google

Hal Zatorski

This author has not been identified. Look up 'Hal Zatorski' in Google

Tom Ting

This author has not been identified. Look up 'Tom Ting' in Google

Cuiping Wu

This author has not been identified. Look up 'Cuiping Wu' in Google