Using the Support Vector Machine as a Classification Method for Software Defect Prediction with Static Code Metrics

David Gray, David Bowes, Neil Davey, Yi Sun, Bruce Christianson. Using the Support Vector Machine as a Classification Method for Software Defect Prediction with Static Code Metrics. In Dominic Palmer-Brown, Chrisina Draganova, Elias Pimenidis, Haris Mouratidis, editors, Engineering Applications of Neural Networks - 11th International Conference, EANN 2009, London, UK, August 27-29, 2009. Proceedings. Volume 43 of Communications in Computer and Information Science, pages 223-234, 2009. [doi]

Authors

David Gray

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David Bowes

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Neil Davey

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Yi Sun

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Bruce Christianson

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