Torsten Grüning, Udo Mahlstedt, Hartmut Koopmeiners. DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits. In ICCAD. pages 194-197, 1991.
@inproceedings{GruningMK91,
title = {DIATEST: A Fast Diagnostic Test Pattern Generator for Combinational Circuits},
author = {Torsten Grüning and Udo Mahlstedt and Hartmut Koopmeiners},
year = {1991},
tags = {testing, diagnostics},
researchr = {https://researchr.org/publication/GruningMK91},
cites = {0},
citedby = {0},
pages = {194-197},
booktitle = {ICCAD},
}