Ultra-fast CAD scan chain highlighting for failure analysis assistance

Markus Grützner, Christian Burmer, Christof Brillert. Ultra-fast CAD scan chain highlighting for failure analysis assistance. Microelectronics Reliability, 50(9-11):1494-1498, 2010. [doi]

Authors

Markus Grützner

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Christian Burmer

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Christof Brillert

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