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H. Gualous, R. Gallay, G. Alcicek, Boubekeur Tala-Ighil, A. Oukaour, B. Boudart, Ph. Makany. Supercapacitor ageing at constant temperature and constant voltage and thermal shock. Microelectronics Reliability, 50(9-11):1783-1788, 2010. [doi]