Backdoor Defense via Test-Time Detecting and Repairing

Jiyang Guan, Jian Liang, Ran He 0001. Backdoor Defense via Test-Time Detecting and Repairing. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024, Seattle, WA, USA, June 16-22, 2024. pages 24564-24573, IEEE, 2024. [doi]

Authors

Jiyang Guan

This author has not been identified. Look up 'Jiyang Guan' in Google

Jian Liang

This author has not been identified. Look up 'Jian Liang' in Google

Ran He 0001

This author has not been identified. Look up 'Ran He 0001' in Google