Yingchun Guan, Guangjun Wu, Wei Huang, Jun Yan, Lin Wang, Yi Yi. Gray Level Co-occurrence Matrix-based Defect Detection Method for Photovoltaic Power Plant Panels. In International Conference on Computers, Information Processing and Advanced Education, CIPAE 2023, Ottawa, ON, Canada, August 26-28, 2023. pages 703-707, IEEE, 2023. [doi]
@inproceedings{GuanWHYWY23,
title = {Gray Level Co-occurrence Matrix-based Defect Detection Method for Photovoltaic Power Plant Panels},
author = {Yingchun Guan and Guangjun Wu and Wei Huang and Jun Yan and Lin Wang and Yi Yi},
year = {2023},
doi = {10.1109/CIPAE60493.2023.00136},
url = {https://doi.org/10.1109/CIPAE60493.2023.00136},
researchr = {https://researchr.org/publication/GuanWHYWY23},
cites = {0},
citedby = {0},
pages = {703-707},
booktitle = {International Conference on Computers, Information Processing and Advanced Education, CIPAE 2023, Ottawa, ON, Canada, August 26-28, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4271-0},
}