Investigation of stress rupture properties of micro beams using the piezoresistive effect

Taotao Guan, Fang Yang, Wei Wang, Xian Huang, Jun He, Li Zhang, Fengshan Fu, Rui Li, Dacheng Zhang. Investigation of stress rupture properties of micro beams using the piezoresistive effect. In 10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015, Xi'an, China, April 7-11, 2015. pages 537-540, IEEE, 2015. [doi]

@inproceedings{GuanYWHHZFLZ15,
  title = {Investigation of stress rupture properties of micro beams using the piezoresistive effect},
  author = {Taotao Guan and Fang Yang and Wei Wang and Xian Huang and Jun He and Li Zhang and Fengshan Fu and Rui Li and Dacheng Zhang},
  year = {2015},
  doi = {10.1109/NEMS.2015.7147486},
  url = {http://dx.doi.org/10.1109/NEMS.2015.7147486},
  researchr = {https://researchr.org/publication/GuanYWHHZFLZ15},
  cites = {0},
  citedby = {0},
  pages = {537-540},
  booktitle = {10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015, Xi'an, China, April 7-11, 2015},
  publisher = {IEEE},
  isbn = {978-1-4673-6695-3},
}