Reliability of Convolutional Neural Networks: Failure Metrics with Metamorphic Test Cases

Hemanth Gudaparthi, Nan Niu, Boyang Wang, Juha Savolainen. Reliability of Convolutional Neural Networks: Failure Metrics with Metamorphic Test Cases. In 22nd IEEE International Conference on Information Reuse and Integration for Data Science, IRI 2021, Las Vegas, NV, USA, August 10-12, 2021. pages 75-82, IEEE, 2021. [doi]

Authors

Hemanth Gudaparthi

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Nan Niu

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Boyang Wang

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Juha Savolainen

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