Jia-Jiun Gung, Chia-Yu Lin, Pin-Fan Lin, Wei-Kuang Chung. An Incremental Meta Defect Detection System for Printed Circuit Boards. In IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022. pages 307-308, IEEE, 2022. [doi]
@inproceedings{GungLLC22,
title = {An Incremental Meta Defect Detection System for Printed Circuit Boards},
author = {Jia-Jiun Gung and Chia-Yu Lin and Pin-Fan Lin and Wei-Kuang Chung},
year = {2022},
doi = {10.1109/ICCE-Taiwan55306.2022.9869108},
url = {https://doi.org/10.1109/ICCE-Taiwan55306.2022.9869108},
researchr = {https://researchr.org/publication/GungLLC22},
cites = {0},
citedby = {0},
pages = {307-308},
booktitle = {IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2022, Taipei, Taiwan, July 6-8, 2022},
publisher = {IEEE},
isbn = {978-1-6654-7050-6},
}