A complete test set to diagnose scan chain failures - researchr publication authors

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Ruifeng Guo, Yu Huang 0005, Wu-Tung Cheng. A complete test set to diagnose scan chain failures. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]

This author has not been identified. Look up 'Ruifeng Guo' in GoogleThis author has not been identified. Look up 'Yu Huang 0005' in GoogleThis author has not been identified. Look up 'Wu-Tung Cheng' in Google

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