Improving test suite generation quality through machine learning-driven boundary value analysis

Xiujing Guo, Hiroyuki Okamura, Tadashi Dohi. Improving test suite generation quality through machine learning-driven boundary value analysis. Array, 27:100496, 2025. [doi]

Authors

Xiujing Guo

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Hiroyuki Okamura

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Tadashi Dohi

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