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Zhen Guo, Jacob Savir. Analog Circuit Test Using Transfer Function Coefficient Estimates. IEICE Transactions, 87-D(3):642-646, 2004. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Analog Circuit Test using Transfer Function Coe .cient EstimatesZhen Guo, Jacob Savir. itc 2003: 1155-1163 [doi] Coefficient-based test of parametric faults in analog circuitsZhen Guo, Jacob Savir. tim, 55(1):150-157, 2006. [doi]
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