Model-based test generation using extended symbolic grammars

Hai-Feng Guo, Mahadevan Subramaniam. Model-based test generation using extended symbolic grammars. STTT, 16(4):437-455, 2014. [doi]

@article{GuoS14-2,
  title = {Model-based test generation using extended symbolic grammars},
  author = {Hai-Feng Guo and Mahadevan Subramaniam},
  year = {2014},
  doi = {10.1007/s10009-014-0316-3},
  url = {http://dx.doi.org/10.1007/s10009-014-0316-3},
  researchr = {https://researchr.org/publication/GuoS14-2},
  cites = {0},
  citedby = {0},
  journal = {STTT},
  volume = {16},
  number = {4},
  pages = {437-455},
}