Hongjing Guo, Chuanqi Tao, Zhiqiu Huang. Multi-Objective White-Box Test Input Selection for Deep Neural Network Model Enhancement. In 34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023. pages 521-532, IEEE, 2023. [doi]
@inproceedings{GuoTH23,
title = {Multi-Objective White-Box Test Input Selection for Deep Neural Network Model Enhancement},
author = {Hongjing Guo and Chuanqi Tao and Zhiqiu Huang},
year = {2023},
doi = {10.1109/ISSRE59848.2023.00051},
url = {https://doi.org/10.1109/ISSRE59848.2023.00051},
researchr = {https://researchr.org/publication/GuoTH23},
cites = {0},
citedby = {0},
pages = {521-532},
booktitle = {34th IEEE International Symposium on Software Reliability Engineering, ISSRE 2023, Florence, Italy, October 9-12, 2023},
publisher = {IEEE},
isbn = {979-8-3503-1594-3},
}