Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process - researchr publication authors

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Hari Shanker Gupta, Singh Shruti Satyendra, Bhumika Deo, Rane Prathamesh Santosh, Ritesh Khole, Varun Dev Singh, Nishant Kumar, Krish Prakash. Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process. In 28th International Symposium on VLSI Design and Test, VDAT 2024, Vellore, India, September 1-3, 2024. pages 1-4, IEEE, 2024. [doi]

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