A Practical Method Based on Bayes Boundary-Ness for Optimal Classifier Parameter Status Selection

David Ha, Yuya Tomotoshi, Masahiro Senda, Hideyuki Watanabe, Shigeru Katagiri, Miho Ohsaki. A Practical Method Based on Bayes Boundary-Ness for Optimal Classifier Parameter Status Selection. VLSI Signal Processing, 92(2):135-151, 2020. [doi]

@article{HaTSWKO20,
  title = {A Practical Method Based on Bayes Boundary-Ness for Optimal Classifier Parameter Status Selection},
  author = {David Ha and Yuya Tomotoshi and Masahiro Senda and Hideyuki Watanabe and Shigeru Katagiri and Miho Ohsaki},
  year = {2020},
  doi = {10.1007/s11265-019-01451-y},
  url = {https://doi.org/10.1007/s11265-019-01451-y},
  researchr = {https://researchr.org/publication/HaTSWKO20},
  cites = {0},
  citedby = {0},
  journal = {VLSI Signal Processing},
  volume = {92},
  number = {2},
  pages = {135-151},
}