Husni M. Habal, Helmut Graeb. A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits. Microelectronics Reliability, 61:17-23, 2016. [doi]
@article{HabalG16,
title = {A step-accurate model for the trapping and release of charge carriers suitable for the transient simulation of analog circuits},
author = {Husni M. Habal and Helmut Graeb},
year = {2016},
doi = {10.1016/j.microrel.2016.01.001},
url = {http://dx.doi.org/10.1016/j.microrel.2016.01.001},
researchr = {https://researchr.org/publication/HabalG16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {61},
pages = {17-23},
}