Don't cares based dynamic test vector compaction in SAT-ATPG

Kareem Habib, Mona Safar, Mohamed Dessouky, Ashraf Salem. Don't cares based dynamic test vector compaction in SAT-ATPG. In IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014. pages 213-217, IEEE, 2014. [doi]

@inproceedings{HabibSDS14,
  title = {Don't cares based dynamic test vector compaction in SAT-ATPG},
  author = {Kareem Habib and Mona Safar and Mohamed Dessouky and Ashraf Salem},
  year = {2014},
  doi = {10.1109/MWSCAS.2014.6908390},
  url = {https://doi.org/10.1109/MWSCAS.2014.6908390},
  researchr = {https://researchr.org/publication/HabibSDS14},
  cites = {0},
  citedby = {0},
  pages = {213-217},
  booktitle = {IEEE 57th International Midwest Symposium on Circuits and Systems, MWSCAS 2014, College Station, TX, USA, August 3-6, 2014},
  publisher = {IEEE},
  isbn = {978-1-4799-4134-6},
}