Philipp Häfliger, Hans Kristian Otnes Berge. Exploiting Gate Leakage in Deep-Submicrometer CMOS for Input Offset Adaptation. IEEE Trans. on Circuits and Systems, 54-II(2):127-130, 2007. [doi]
@article{HafligerB07, title = {Exploiting Gate Leakage in Deep-Submicrometer CMOS for Input Offset Adaptation}, author = {Philipp Häfliger and Hans Kristian Otnes Berge}, year = {2007}, doi = {10.1109/TCSII.2006.886241}, url = {http://dx.doi.org/10.1109/TCSII.2006.886241}, researchr = {https://researchr.org/publication/HafligerB07}, cites = {0}, citedby = {0}, journal = {IEEE Trans. on Circuits and Systems}, volume = {54-II}, number = {2}, pages = {127-130}, }