Achintya Halder, Abhijit Chatterjee. Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 401-406, IEEE Computer Society, 2004. [doi]
@inproceedings{HalderC04, title = {Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits}, author = {Achintya Halder and Abhijit Chatterjee}, year = {2004}, url = {http://csdl.computer.org/comp/proceedings/isqed/2004/2093/00/20930401abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/HalderC04}, cites = {0}, citedby = {0}, pages = {401-406}, booktitle = {5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-2093-6}, }