An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias - researchr publication authors

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Gavin D. R. Hall, Derryl D. J. Allman. An evaluation of accelerated failure time models of stress-migration and stress-induced voiding failures under vias. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]

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