Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria. Probabilistic model checking of single event transient propagation at RTL level. In 21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014. pages 451-454, IEEE, 2014. [doi]
@inproceedings{HamadMS14,
title = {Probabilistic model checking of single event transient propagation at RTL level},
author = {Ghaith Bany Hamad and Otmane Aït Mohamed and Yvon Savaria},
year = {2014},
doi = {10.1109/ICECS.2014.7050019},
url = {http://dx.doi.org/10.1109/ICECS.2014.7050019},
researchr = {https://researchr.org/publication/HamadMS14},
cites = {0},
citedby = {0},
pages = {451-454},
booktitle = {21st IEEE International Conference on Electronics, Circuits and Systems, ICECS 2014, Marseille, France, December 7-10, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4242-8},
}