Multiple Fault Testing in Analog Circuits - researchr publication bibtex

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Naim Ben Hamida, Bozena Kaminska. Multiple Fault Testing in Analog Circuits. In VLSI Design. pages 61-66, 1994.

@inproceedings{HamidaK94,
  title = {Multiple Fault Testing in Analog Circuits},
  author = {Naim Ben Hamida and Bozena Kaminska},
  year = {1994},
  tags = {testing},
  researchr = {https://researchr.org/publication/HamidaK94},
  cites = {0},
  citedby = {0},
  pages = {61-66},
  booktitle = {VLSI Design},
}

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