Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators

Ilker Hamzaoglu, Janak H. Patel. Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators. In 18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada. pages 369-376, IEEE Computer Society, 2000. [doi]

Authors

Ilker Hamzaoglu

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Janak H. Patel

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