D. Han, N. Balakrishnan, A. Sen, E. Gouno. Corrections on Optimal Step-Stress Test Under Progressive Type-I Censoring . IEEE Transactions on Reliability, 55(4):613-614, 2006. [doi]
@article{HanBSG06,
title = {Corrections on Optimal Step-Stress Test Under Progressive Type-I Censoring },
author = {D. Han and N. Balakrishnan and A. Sen and E. Gouno},
year = {2006},
doi = {10.1109/TR.2006.884601},
url = {http://dx.doi.org/10.1109/TR.2006.884601},
tags = {testing, e-science},
researchr = {https://researchr.org/publication/HanBSG06},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {55},
number = {4},
pages = {613-614},
}