Yohan Han, Jongpil Jeong. Real-Time Inspection of Multi-sided Surface Defects Based on PANet Model. In Osvaldo Gervasi, Beniamino Murgante, Sanjay Misra, Chiara Garau, Ivan Blecic, David Taniar, Bernady O. Apduhan, Ana Maria A. C. Rocha, Eufemia Tarantino, Carmelo Maria Torre, Yeliz Karaca, editors, Computational Science and Its Applications - ICCSA 2020 - 20th International Conference, Cagliari, Italy, July 1-4, 2020, Proceedings, Part II. Volume 12250 of Lecture Notes in Computer Science, pages 623-633, Springer, 2020. [doi]
@inproceedings{HanJ20a,
title = {Real-Time Inspection of Multi-sided Surface Defects Based on PANet Model},
author = {Yohan Han and Jongpil Jeong},
year = {2020},
doi = {10.1007/978-3-030-58802-1_45},
url = {https://doi.org/10.1007/978-3-030-58802-1_45},
researchr = {https://researchr.org/publication/HanJ20a},
cites = {0},
citedby = {0},
pages = {623-633},
booktitle = {Computational Science and Its Applications - ICCSA 2020 - 20th International Conference, Cagliari, Italy, July 1-4, 2020, Proceedings, Part II},
editor = {Osvaldo Gervasi and Beniamino Murgante and Sanjay Misra and Chiara Garau and Ivan Blecic and David Taniar and Bernady O. Apduhan and Ana Maria A. C. Rocha and Eufemia Tarantino and Carmelo Maria Torre and Yeliz Karaca},
volume = {12250},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-58802-1},
}