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Reliability of MRI-derived measurements of human cerebral cortical thickness: The effects of field strength, scanner upgrade and manufacturer

Xiao Han, Jorge Jovicich, David H. Salat, André J. W. van der Kouwe, Brian T. Quinn, Silvester Czanner, Evelina Busa, Jenni Pacheco, Marilyn S. Albert, Ronald J. Killiany, R. Paul Maguire, H. Diana Rosas, Nikos Makris, Anders M. Dale, Bradford C. Dickerson, Bruce Fischl. Reliability of MRI-derived measurements of human cerebral cortical thickness: The effects of field strength, scanner upgrade and manufacturer. NeuroImage, 32(1):180-194, 2006. [doi]

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