David Han, Debasis Kundu. Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring. IEEE Transactions on Reliability, 64(1):31-43, 2015. [doi]
@article{HanK15,
title = {Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring},
author = {David Han and Debasis Kundu},
year = {2015},
doi = {10.1109/TR.2014.2336392},
url = {http://dx.doi.org/10.1109/TR.2014.2336392},
researchr = {https://researchr.org/publication/HanK15},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {64},
number = {1},
pages = {31-43},
}