Automatic Detection of Failure Patterns Using Data Mining

Youngshin Han, Junghee Kim, Chilgee Lee. Automatic Detection of Failure Patterns Using Data Mining. In Rajiv Khosla, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based Intelligent Information and Engineering Systems, 9th International Conference, KES 2005, Melbourne, Australia, September 14-16, 2005, Proceedings, Part II. Volume 3682 of Lecture Notes in Computer Science, pages 1312-1316, Springer, 2005. [doi]

Authors

Youngshin Han

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Junghee Kim

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Chilgee Lee

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