Yan Han, Bo Song, Shurong Dong, Mingliang Li, Fei Ma, Meng Miao, Kehan Zhu. Study of current saturation behaviors in dual direction SCR for ESD applications. Microelectronics Reliability, 51(2):332-336, 2011. [doi]
@article{HanSDLMMZ11,
title = {Study of current saturation behaviors in dual direction SCR for ESD applications},
author = {Yan Han and Bo Song and Shurong Dong and Mingliang Li and Fei Ma and Meng Miao and Kehan Zhu},
year = {2011},
doi = {10.1016/j.microrel.2010.08.002},
url = {http://dx.doi.org/10.1016/j.microrel.2010.08.002},
researchr = {https://researchr.org/publication/HanSDLMMZ11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {2},
pages = {332-336},
}