Uncertainty with the Gamma Test for model input data selection

Dawei Han, Weizhong Yan, Ali Moghaddam Nia. Uncertainty with the Gamma Test for model input data selection. In International Joint Conference on Neural Networks, IJCNN 2010, Barcelona, Spain, 18-23 July, 2010. pages 1-5, IEEE, 2010. [doi]

Authors

Dawei Han

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Weizhong Yan

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Ali Moghaddam Nia

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