Fran Hanchek, Shantanu Dutt. Node-Covering Based Defect and Fault Tolerance Methods for Increased Yield in FPGAs. In 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India. pages 225-229, IEEE Computer Society, 1996. [doi]
@inproceedings{HanchekD96,
title = {Node-Covering Based Defect and Fault Tolerance Methods for Increased Yield in FPGAs},
author = {Fran Hanchek and Shantanu Dutt},
year = {1996},
doi = {10.1109/ICVD.1996.489489},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489489},
tags = {rule-based},
researchr = {https://researchr.org/publication/HanchekD96},
cites = {0},
citedby = {0},
pages = {225-229},
booktitle = {9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India},
publisher = {IEEE Computer Society},
}