Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian. Minimal March Tests for Dynamic Faults in Random Access Memories. In 11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK. pages 43-48, IEEE Computer Society, 2006. [doi]
@inproceedings{HarutunyanVZ06,
title = {Minimal March Tests for Dynamic Faults in Random Access Memories},
author = {Gurgen Harutunyan and Valery A. Vardanian and Yervant Zorian},
year = {2006},
doi = {10.1109/ETS.2006.32},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2006.32},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/HarutunyanVZ06},
cites = {0},
citedby = {0},
pages = {43-48},
booktitle = {11th European Test Symposium (ETS 2006), 21-24 May 2006, Southhampton, UK},
publisher = {IEEE Computer Society},
isbn = {0-7695-2566-0},
}