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Smart Mining for Deep Metric Learning

Ben Harwood, Vijay Kumar B. G, Gustavo Carneiro, Ian Reid, Tom Drummond. Smart Mining for Deep Metric Learning. In IEEE International Conference on Computer Vision, ICCV 2017, Venice, Italy, October 22-29, 2017. pages 2840-2848, IEEE, 2017. [doi]

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Ben Harwood

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Vijay Kumar B. G

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Gustavo Carneiro

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Ian Reid

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Tom Drummond

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