Mahdi Hasanzadeh, Ebadollah Taheri, Mansour Shafaei, Ahmad Patooghy. FasTest: A Concurrent Strategy to Test Components of 3D Network-on-Chips. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 65-68, IEEE, 2019. [doi]
@inproceedings{HasanzadehTSP19,
title = {FasTest: A Concurrent Strategy to Test Components of 3D Network-on-Chips},
author = {Mahdi Hasanzadeh and Ebadollah Taheri and Mansour Shafaei and Ahmad Patooghy},
year = {2019},
doi = {10.1109/MWSCAS.2019.8885395},
url = {https://doi.org/10.1109/MWSCAS.2019.8885395},
researchr = {https://researchr.org/publication/HasanzadehTSP19},
cites = {0},
citedby = {0},
pages = {65-68},
booktitle = {62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019},
editor = {Hoi Lee and Randall L. Geiger},
publisher = {IEEE},
isbn = {978-1-7281-2788-0},
}