David Haupert, Fu-Gin Chen, David Lee. VLSI Package Reliability Risk Due to Accelerated Environmental Testing. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 938, IEEE Computer Society, 1989.
@inproceedings{HaupertCL89,
title = {VLSI Package Reliability Risk Due to Accelerated Environmental Testing},
author = {David Haupert and Fu-Gin Chen and David Lee},
year = {1989},
tags = {testing, reliability},
researchr = {https://researchr.org/publication/HaupertCL89},
cites = {0},
citedby = {0},
pages = {938},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989},
publisher = {IEEE Computer Society},
}