David C. Hay. Advanced Data Model Patterns. In Alberto H. F. Laender, Stephen W. Liddle, Veda C. Storey, editors, Conceptual Modeling - ER 2000, 19th International Conference on Conceptual Modeling, Salt Lake City, Utah, USA, October 9-12, 2000, Proceedings. Volume 1920 of Lecture Notes in Computer Science, pages 579, Springer, 2000. [doi]
@inproceedings{Hay00,
title = {Advanced Data Model Patterns},
author = {David C. Hay},
year = {2000},
url = {http://link.springer.de/link/service/series/0558/bibs/1920/19200579.htm},
tags = {meta-model, data-flow, C++, Meta-Environment},
researchr = {https://researchr.org/publication/Hay00},
cites = {0},
citedby = {0},
pages = {579},
booktitle = {Conceptual Modeling - ER 2000, 19th International Conference on Conceptual Modeling, Salt Lake City, Utah, USA, October 9-12, 2000, Proceedings},
editor = {Alberto H. F. Laender and Stephen W. Liddle and Veda C. Storey},
volume = {1920},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-41072-4},
}