Shinpei Hayashi, Takashi Kobayashi 0001, Tadahisa Kato. Evaluation of Cross-Lingual Bug Localization: Two Industrial Cases. In IEEE International Conference on Software Maintenance and Evolution, ICSME 2023, Bogotá, Colombia, October 1-6, 2023. pages 495-499, IEEE, 2023. [doi]
@inproceedings{Hayashi0K23,
title = {Evaluation of Cross-Lingual Bug Localization: Two Industrial Cases},
author = {Shinpei Hayashi and Takashi Kobayashi 0001 and Tadahisa Kato},
year = {2023},
doi = {10.1109/ICSME58846.2023.00063},
url = {https://doi.org/10.1109/ICSME58846.2023.00063},
researchr = {https://researchr.org/publication/Hayashi0K23},
cites = {0},
citedby = {0},
pages = {495-499},
booktitle = {IEEE International Conference on Software Maintenance and Evolution, ICSME 2023, Bogotá, Colombia, October 1-6, 2023},
publisher = {IEEE},
isbn = {979-8-3503-2783-0},
}