Jane Huffman Hayes, Wenbin Li, Tingting Yu, Xue Han, Mark Hays, Clinton Woodson. Measuring Requirement Quality to Predict Testability. In 2015 IEEE Second International Workshop on Artificial Intelligence for Requirements Engineering, AIRE 2015, Ottawa, ON, Canada, August 24, 2015. pages 1-8, IEEE, 2015. [doi]
@inproceedings{HayesLYHHW15,
title = {Measuring Requirement Quality to Predict Testability},
author = {Jane Huffman Hayes and Wenbin Li and Tingting Yu and Xue Han and Mark Hays and Clinton Woodson},
year = {2015},
doi = {10.1109/AIRE.2015.7337622},
url = {http://dx.doi.org/10.1109/AIRE.2015.7337622},
researchr = {https://researchr.org/publication/HayesLYHHW15},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2015 IEEE Second International Workshop on Artificial Intelligence for Requirements Engineering, AIRE 2015, Ottawa, ON, Canada, August 24, 2015},
publisher = {IEEE},
isbn = {978-1-5090-0125-5},
}