Using a manufacturing constraint network to identify cost-critical areas of designs

Carolyn C. Hayes, Harold C. Sun. Using a manufacturing constraint network to identify cost-critical areas of designs. AI EDAM, 9(2):73-87, 1995. [doi]

@article{HayesS95-0,
  title = {Using a manufacturing constraint network to identify cost-critical areas of designs},
  author = {Carolyn C. Hayes and Harold C. Sun},
  year = {1995},
  doi = {10.1017/S0890060400002134},
  url = {http://dx.doi.org/10.1017/S0890060400002134},
  researchr = {https://researchr.org/publication/HayesS95-0},
  cites = {0},
  citedby = {0},
  journal = {AI EDAM},
  volume = {9},
  number = {2},
  pages = {73-87},
}