Jane Huffman Hayes, Pifu Zhang. Fault Detection Effectiveness of Spathic Test Data. In 8th International Conference on Engineering of Complex Computer Systems (ICECCS 2002), 2-4 December 2002, Greenbelt, MD, USA. pages 183-192, IEEE Computer Society, 2002. [doi]
@inproceedings{HayesZ02, title = {Fault Detection Effectiveness of Spathic Test Data}, author = {Jane Huffman Hayes and Pifu Zhang}, year = {2002}, url = {http://csdl.computer.org/comp/proceedings/iceccs/2002/1757/00/17570183abs.htm}, tags = {testing, data-flow}, researchr = {https://researchr.org/publication/HayesZ02}, cites = {0}, citedby = {0}, pages = {183-192}, booktitle = {8th International Conference on Engineering of Complex Computer Systems (ICECCS 2002), 2-4 December 2002, Greenbelt, MD, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-1757-9}, }