Quantized DCT on H26L Test Model

Yingjian He, Mohamed El-Sharkawy. Quantized DCT on H26L Test Model. In Narayan C. Debnath, editor, Proceedings of the ISCA 18th International Conference Computers and Their Applications, Honolulu, Hawaii, USA, March 26-28, 2003. pages 50-54, ISCA, 2003.

@inproceedings{HeE03,
  title = {Quantized DCT on H26L Test Model},
  author = {Yingjian He and Mohamed El-Sharkawy},
  year = {2003},
  tags = {testing},
  researchr = {https://researchr.org/publication/HeE03},
  cites = {0},
  citedby = {0},
  pages = {50-54},
  booktitle = {Proceedings of the ISCA 18th International Conference Computers and Their Applications, Honolulu, Hawaii, USA, March 26-28, 2003},
  editor = {Narayan C. Debnath},
  publisher = {ISCA},
  isbn = {1-880843-46-3},
}