An Adaptive DFE Using Pattern-Dependent Data-Level Reference in 28 nm CMOS Technology - researchr publication authors

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Ai He, Weixin Gai, Kai Sheng, Ninghuang Li. An Adaptive DFE Using Pattern-Dependent Data-Level Reference in 28 nm CMOS Technology. In Fan Ye, Ting-Ao Tang, editors, 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021. pages 1-4, IEEE, 2021. [doi]

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