Xiangjie He, Zhongqiang Luo, Quanyang Li, Hongbo Chen, Feng Li. DG-GAN: A High Quality Defect Image Generation Method for Defect Detection. Sensors, 23(13):5922, July 2023. [doi]
@article{HeLLCL23,
title = {DG-GAN: A High Quality Defect Image Generation Method for Defect Detection},
author = {Xiangjie He and Zhongqiang Luo and Quanyang Li and Hongbo Chen and Feng Li},
year = {2023},
month = {July},
doi = {10.3390/s23135922},
url = {https://doi.org/10.3390/s23135922},
researchr = {https://researchr.org/publication/HeLLCL23},
cites = {0},
citedby = {0},
journal = {Sensors},
volume = {23},
number = {13},
pages = {5922},
}