Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation

Kangzhe He, Qiuzhuang Sun, Min Xie 0001, Way Kuo. Sequential Bayesian Planning for Accelerated Degradation Tests Considering Sensor Degradation. IEEE Transactions on Reliability, 72(3):964-974, September 2023. [doi]

Authors

Kangzhe He

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Qiuzhuang Sun

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Min Xie 0001

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Way Kuo

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