Shunfan He, Wei Tian, Rongbo Zhu, Yan Zhang 0002, Sun Mao. Electrical Signature Analysis for Open-Circuit Faults Detection of Inverter With Various Disturbances in Distribution Grid. IEEE Trans. Industrial Informatics, 19(7):8351-8361, July 2023. [doi]
@article{HeTZZM23,
title = {Electrical Signature Analysis for Open-Circuit Faults Detection of Inverter With Various Disturbances in Distribution Grid},
author = {Shunfan He and Wei Tian and Rongbo Zhu and Yan Zhang 0002 and Sun Mao},
year = {2023},
month = {July},
doi = {10.1109/TII.2022.3217757},
url = {https://doi.org/10.1109/TII.2022.3217757},
researchr = {https://researchr.org/publication/HeTZZM23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {19},
number = {7},
pages = {8351-8361},
}