Dynamic Scanning Electromagnetic Infrared Thermographic Analysis Based on Blind Source Separation for Industrial Metallic Damage Evaluation

Yunze He, Ruizhen Yang, Xuan Wu, Shoudao Huang. Dynamic Scanning Electromagnetic Infrared Thermographic Analysis Based on Blind Source Separation for Industrial Metallic Damage Evaluation. IEEE Trans. Industrial Informatics, 14(12):5610-5619, 2018. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.