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Automated setup for thermal imaging and electrical degradation study of power DMOS devices

M. Heer, V. Dubec, M. Blaho, Scrgey Bychikhin, Dionyz Pogany, E. Gornik, M. Denison, M. Stecher, G. Groos. Automated setup for thermal imaging and electrical degradation study of power DMOS devices. Microelectronics Reliability, 45(9-11):1688-1693, 2005. [doi]

Authors

M. Heer

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V. Dubec

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M. Blaho

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Scrgey Bychikhin

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Dionyz Pogany

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E. Gornik

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M. Denison

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M. Stecher

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G. Groos

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