Sybille Hellebrand, Hans-Joachim Wunderlich. The Pseudo-Exhaustive Test of Sequential Circuits. In Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989. pages 19-27, IEEE Computer Society, 1989.
@inproceedings{HellebrandW89,
title = {The Pseudo-Exhaustive Test of Sequential Circuits},
author = {Sybille Hellebrand and Hans-Joachim Wunderlich},
year = {1989},
tags = {testing},
researchr = {https://researchr.org/publication/HellebrandW89},
cites = {0},
citedby = {0},
pages = {19-27},
booktitle = {Proceedings International Test Conference 1989, Washington, D.C., USA, August 1989},
publisher = {IEEE Computer Society},
}